Development of an efficient testing methodology for system on chip design

dc.contributor.advisorBhaumik, Haripada and Chattopadhyay, Santanu
dc.contributor.authorDas, Gautam
dc.date.accessioned2017-07-23T10:14:46Z
dc.date.available2017-07-23T10:14:46Z
dc.date.issued2009
dc.identifier.accn223076
dc.identifier.cnTH 620.0042/D229d
dc.identifier.urihttps://ir.nbu.ac.in/handle/123456789/1412
dc.language.isoenen_US
dc.publisherUniversity of North Bengalen_US
dc.subjectTesting methodologyen_US
dc.subjectChip designen_US
dc.titleDevelopment of an efficient testing methodology for system on chip designen_US
dc.typeThesisen_US

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