Please use this identifier to cite or link to this item: http://ir.nbu.ac.in/handle/123456789/1412
Title: Development of an efficient testing methodology for system on chip design
Other Titles: Bhaumik, Haripada and Chattopadhyay, Santanu
Authors: Das, Gautam
Keywords: Testing methodology
Chip design
Issue Date: 2009
Publisher: University of North Bengal
Series/Report no.: Accession Number;223076
URI: Th 620.0042:D229d
http://ir.nbu.ac.in/handle/123456789/1412
Appears in Collections:Department of Engineering

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01_title.pdf24.26 kBAdobe PDFThumbnail
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02_dedicated.pdf27.76 kBAdobe PDFThumbnail
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03_acknowledgement.pdf35.93 kBAdobe PDFThumbnail
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04_declaration.pdf9.1 kBAdobe PDFThumbnail
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05_certificate.pdf32.46 kBAdobe PDFThumbnail
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06_abstract.pdf36.81 kBAdobe PDFThumbnail
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07_table of contents.pdf69.32 kBAdobe PDFThumbnail
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08_list of figures.pdf71.6 kBAdobe PDFThumbnail
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09_list of tables.pdf40.42 kBAdobe PDFThumbnail
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10_list of algorithm.pdf14.62 kBAdobe PDFThumbnail
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11_list of abbreviations.pdf50.71 kBAdobe PDFThumbnail
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12_chapter_01.pdf203.5 kBAdobe PDFThumbnail
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13_chapter_02.pdf1.7 MBAdobe PDFThumbnail
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14_chapter_03.pdf636 kBAdobe PDFThumbnail
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15_chapter_04.pdf1.06 MBAdobe PDFThumbnail
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16_chapter_05.pdf750.66 kBAdobe PDFThumbnail
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17_chapter_06.pdf606.96 kBAdobe PDFThumbnail
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18_chapter_07.pdf60.36 kBAdobe PDFThumbnail
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19_references.pdf730.72 kBAdobe PDFThumbnail
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223076.pdfFull Thesis6.22 MBAdobe PDFThumbnail
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